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An optical scattering measurement characterizes how light is reflected or transmitted from any surface or material. It quantifies the amount of light propagated from a surface or material depending on the angle of incidence, wavelenghts, polarization and observation angle.
Optical scattering measurements are useful for many aspects of optical design:
LightTools and LucidShape products offer SmartStart Libraries of materials and media commonly used in the design of optical systems to help our customers save time and reduce development costs. We continuously augment our SmartStart Libraries to expand customer access to precision light scattering data for faster, physics-based system modeling.
OPTICAL SCATTERING MEASUREMENT SERVICES
Need custom scattering measurements? Our in-house laboratory is light- and temperature-controlled to provide an optimal measurement environment. Our optical experts provide the following SmartStart Measurement Services:
SERVICE FOR HIGH SPECULAR MATERIALS
Our Synopsys high specular bench is well suited for backward and forward light scatter characterization for all types of materials and objects. The system measures BRDF and BTDF, which perfectly represents the way any surface scatters incoming light in 2D space.
Co-developed with the Center for National Scientific Research (CNRS), the high specular bench has been extended into the infrared wavelengths (3.39 and 10.6 ?m). We can now provide scatter measurements from the ultraviolet wavelength of 280 nm to the infrared wavelength of 10.6 ?m with a dynamic range of 1013.
The high specular bench is 10 meters long, giving it a minimum resolution of 0.02¡ã from the specular direction.
This system is for measurement services only and is not part of our equipment offerings.
FOR ACCURATE LIGHT REFLECTANCE, TRANSMITTANCE AND ABSORPTION MEASUREMENTS
Synopsys TIS Pro is an optical scattering instrument for efficient measurements of reflectance, transmittance and absorption. This fully automated device features an integrated sphere and a spectral detector assembled in a housing that controls stray light to ensure fast, accurate measurement results.
Synopsys TIS Pro determines the optical properties of surfaces and materials and provides measurements over the entire visible spectrum at various angles of incidence.
COMPACT AND PORTABLE MEASUREMENT SOLUTION
Synopsys Mini-Diff V2 is a compact, portable solution for optical scattering characterization. You can measure the BRDF and BTDF of any kind of material and object. Synopsys Mini-Diff V2 accurately captures measured surface characteristics, including roughness, defects, coatings, and paint.
Synopsys Mini-Diff V2 is delivered with its own suitcase, which includes calibration standards, software, and cables.
ROBUST 2D/3D SCATTERING MEASUREMENT CAPABILITIES
Synopsys Mini-Diff VPro is a camera-based 3D hemispherical scattering measurement solution. Like the Synopsys Mini-Diff V2, the Synopsys Mini-Diff VPro provides BRDF, BTDF, and TIS measurements. It delivers color, reflectance, and transmittance data.
The Synopsys Mini-Diff VPro is integrated in a single box, which controls stray light and temperature deviation during measurements, and provides a high level of stability and precision. The instrument offers a choice of incident angle on the sample from 0 ¡ã to 60¡ã, motorized and controlled from the Synopsys Mini-Diff software.
STAND-ALONE SCATTERING MEASUREMENTS SYSTEM
The Synopsys REFLET 180S optical bench is easy to use for spot inspection or quick analysis. Synopsys REFLET 180S is especially suited for backward and forward light scatter characterization for all types of materials and objects. It allows you to measure the light distribution contained in the radiation lobe of these materials in photometric and colorimetric terms. Moreover, the system measures BRDF and BTDF, which perfectly represents the way any surface scatters incoming light in 3D space.
Mini-Diff V2 | Mini-Diff VPro | REFLET 180S | High Specular | |
---|---|---|---|---|
Measurement of Light Scattering | ARS/BRDF/BTDF | ARS, BRDF and BTDF | ARS/BRDF/BTDF | ARS/BRDF/BTDF |
Wavelength Light Source | 465 - 525 - 630 nm - 850 nm and 940 nm | 465 nm, 525 nm and 630 nm | Halogen white lamp + passband filter | Discrete values from 280 nm to 10.6 ?m |
Wavelength Detector Sensitivity | NA | NA | Visible Infrared 900-1700 nm Optional Spectrometer [400-800] nm | NA |
Angles of Incidence | Fixed for BRDF and BTDF: 0¡ã, 20¡ã, 40¡ã and 60¡ã | Tunable: For BRDF and BTDF: from 0¡ã to +60¡ã |
Tunable: For BRDF and BTDF: from 0¡ã to +90¡ã | Tunable: For BRDF: from 5¡ã to +90¡ã For BTDF: From 0¡ã to +90¡ã |
Angular Range | 3D spherical measurement | 3D spherical measurement | 2D and 3D spherical measurement | 2D spherical measurement |
Spot Size (diameter) | > 1 mm | > 1 mm | 1 mm to 13 mm continuous | 2 mm to 14 mm depending on wavelengths |
Observed Area Size | ? 1 mm | ? 1 mm | ? 6 mm /? 8 mm /? 14 mm | NA |
Beam Divergence | NA | NA | +/- 2.26¡ã to +/- 0.15¡ã | +/- 0.01¡ã for visible +/-0.1¡ã for infrared |
Incident Beam Positioning Precision | NA | NA | 0.001¡ã | +/- 0.001¡ã |
Detector Acceptance Angle | +/- 0.5¡ã | +/- 0.5¡ã | +/- 0.04¡ã / 1.1¡ã / 2¡ã | +/- 0.001¡ã |
Detector Positioning Precision | NA | NA | 0.001¡ã | NA |
Measurement Resolution | 1¡ã | 1¡ã | 0.01¡ã/0.1¡ã/1¡ã/10¡ã | 0.001¡ã |
Global Axes Alignment | 1¡ã | 1¡ã | < 0.5¡ã | 0.002¡ã |
Accuracy | < 5% | < 2% | < 1% | < 1% |
Repeatability | < 2% | < 2% | < 1% | < 1% |
Minimum BRDF | 10e-2 | 10e-3 | < 10e-4 | < 10e-7 (10e-5 for infrared) |
Dynamic Range | 10e5 | 10e6 for BTDF 10e5 for BRDF |
10e9 for visible and 10e6 for infrared | 10e13 for visible and 10e9 for infrared |
Minimum Signature | +/- 1¡ã for BTDF at 0¡ã at 525 nm | +/- 0.5¡ã for BTDF at 0¡ã at 525 nm | +/- 0.15¡ã | +/- 0.01¡ã for visible and +/- 0.1¡ã for infrared |
Weight | 2 kg | 42 kg | 80 kg | NA |
Dimensions | 10 x 10 x 30 cm | 450 mm x 600 mm x 738 mm | 86 x 98 x 122 cm | NA |
Advantages | Plug and play Easy to use and fast Portable and compact Affordable |
High precision High stability Easy-to-use instrument Laboratory version of the Mini-Diff V2 | High dynamic range High precision High repeatability Customizable wavelength range | Very high dynamic range Measurement at 0.02¡ã from the specular High precision High repeatability Customizable wavelength range |
Our customer success team is anchored by experienced engineers who are optical scattering experts. If you ever need help, our team is available. We also provide an extensive library of on-demand learning resources, including videos, documentation, tutorials and example models.