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Synopsys TestMAX Advisor: Accelerating Shift Left with Early RTL Analysis and Optimization

In the ever-evolving landscape of semiconductor design, RTL designers continually grapple with the challenges posed by growing design sizes, increased device complexity and shrinking design cycles. To navigate these challenges effectively, early RTL testability analysis and optimization is essential.

This whitepaper explores the synergistic relationship between Shift Left, RTL testability analysis, and optimization for addressing critical aspects of the design process such as early identification of testability issues, quality estimates and improved turnaround time (TAT).