Cloud native EDA tools & pre-optimized hardware platforms
Odyssey is also a complete in-line Yield Management System that analyzes semiconductor production and test data in order to quickly identify tools and processes that impact yield.
Synopsys¡¯ Odyssey product line consists of multiple components to satisfy the requirements of today¡¯s modern semiconductor fabs. Odyssey Defect is a production-proven defect data management solution has helped over thirty-five manufacturing sites manage their defectivity issues. With over fourteen years of developmental history, Odyssey Defect provides real-time lot dispositioning, SPC alarming and a complete set of defect analysis tools to help fab engineers resolve both random and systematic yield issues. A true 24x7 system, Odyssey Defect delivers results efficiently and reliably, leveraging error-correcting processes to assure users of maximum up time. Odyssey Defect has an open and vendor-neutral architecture that supports all inspection, review and classification tools with a full range of interactive charting, wafer mapping and reporting capabilities.