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High-Accuracy 3D Parasitic Field Solver
QuickCap NX is the golden extraction reference tool based on high accuracy 3D Field Solver which is well suited for advanced 14nm FinFET and beyond process technologies. Embedded 3D device visualizer makes it ideal for process exploration. High accuracy extraction, reference tool to rule based extractor, standard cell characterization, memory cell characterization and enhancing PDK quality are some of the key applications served by QuickCap NX.
Key Benefits
High Accuracy
Achieve precise 3D parasitic extraction for advanced nodes.
Enhanced Visualization
Embedded 3D viewer for detailed process profile insights.
Increased Productivity
Multicore processing and hierarchical extraction for faster runtimes.
Product Highlights
- Field solver solution for early process technology node exploration and parasitic modeling development
- Advanced random-walk algorithm offers self-capacitance, coupling capacitance and distributed capacitance extraction for test structures and critical nets
- Supports detailed process modeling of complex geometries and process effects for accurate analysis of device and interconnect parasitics at 14nm and below
- Adopted by Foundries for high-accuracy 3D FinFET modeling using uniquely detailed silicon profiles
- 3D graphical viewer allows visibility into the exact process profile being modeled
- Faster runtime enabled by multicore processing, tiling, bounded nets and hierarchical extraction for increased designer productivity
- Scalable to support library characterization
- Ideal extraction reference tool for chip design companies
QuickCap NX 3D field solver solution enables early process exploration and characterization
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