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Synopsys Webinar | Available On-Demand

Continuously increasing semiconductor design sizes and complexity have resulted in increased test costs. Today¡¯s competitive environment and critical market windows are pushing companies to adopt aggressive design schedules. The traditional method of manual iterations and fine-tuning test configurations to optimize test quality-of-results (QoR) is highly unpredictable and inefficient. Engineers can no longer rely on such approaches to meet deadlines or achieve optimal results. With a global shrinking engineering workforce, intelligent automation is needed for higher productivity and delivering first-time-right results.  

 

This Synopsys webinar discusses our newly introduced AI-driven test technology called Synopsys TSO.ai?¨C Test Space Optimization AI that dramatically minimizes test cost and time-to-market for today's complex designs. Synopsys TSO.ai learns and converges the large ATPG search space to automatically minimize test patterns and eliminate ineffective user iterations, enabling expert-level productivity at scale. Current engagements with leading semiconductor companies are showing an average of 20% to 25% pattern count reduction or even higher on some designs.  

Speaker

Listed below is the industry leader scheduled to speak.

rahul singhal headshot

Rahul Singhal

Product Manager
Synopsys

Rahul Singhal is a Product Manager for Synopsys TestMAX DFT, Synopsys TestMAX ATPG and Test-AI products at Synopsys. His focus is on industry requirements and solutions in the areas of test compression, test streaming solutions and ATPG. He has co-authored multiple tutorials, papers, posters on test in leading IEEE conferences. Rahul received his MS in Electrical Engineering from Portland State University and BS in Electrical Engineering from Purdue University.

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